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Center for Manufacturing and Metrology Upcoming Events

Applied Scanning Electron Microscopy

Postponed - Date to be announced
University of Hartford

Speakers

Dr. Michael T. Postek, Senior Scientist, Physical Measurement Laboratory, NIST

Timothy K. Maugel, Director of the College of Life Sciences' Laboratory for Biological Ultrastructure, University of Maryland, College Park, MD

Industrial, government and academic scientists have found an increasing need for the scanning electron microscope (SEM) in numerous research, production and quality control applications. Manufacturers of microscopes and accessory equipment have responded to this increased demand with advanced instruments equipped with a wide range of innovative features. To obtain maximum performance from these state-of-the-art instruments, a basic theoretical and practical knowledge of SEM and associated techniques is essential. This intensive four and one-half day course is designed to provide SEM operators with basic theoretical and practical training through the use of integrated lectures and extensive supervised hands-on laboratory exercises on contemporary SEMs equipped with modern accessories. Applied aspects of SEM is directed toward government, academic and industrial users of the SEM who are interested in learning current practical methodology in the operation of the SEM and accessory equipment. The lectures and laboratory exercises are beneficial to microscopists at all levels from novice through advanced users. Due to the limited class size, participants have the opportunity to acquire extensive hands-on experience with modern SEM instrumentation and sample preparation equipment. A total of 16 hours of lecture and a minimum of 20 hours in hands-on laboratory sessions are scheduled into this course.



Cost

$2,395 per person


Laboratory Sessions Include

Basic SEM Operation, Electron Detectors, Low/High Magnification/Resolution Operation, High/Low keV Operation, Qualitative and Quantitative X-ray Microanalysis, Image Analysis, Instrument Maintenance, Voltage Contrast/EBIC.

Dr. Postek is a Senior Scientist and a Supervisory Physical Scientist in the Semiconductor & Dimensional Metrology Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He is the lead author of “Scanning Electron Microscopy: A Student’s Handbook” and numerous research papers.

Timothy K. Maugel is the Director of the College of Life Sciences' Laboratory for Biological Ultrastructure at the University of Maryland, College Park, MD.


Session Date and Time

Date to be announced | Dana Hall 102

Monday
TBD

01:00-5:00 PM

Lectures 1 and 2
Course Introduction, Principles of the SEM
Tuesday
TBD

08:00-Noon

Lectures 3 and 4
Operation of the SEM, Derivation of Signals Useful to SEM Collection of Signals

Noon -1:00 PM 

Lunch

1:00-05:15 PM

Lab Sessions I and II

Wednesday
TBD

08:00-Noon

Lectures 5 and 6

Low Accelerating Voltage, SEM Sample Preparation, SEM Based Metrology

Noon-1:00 PM

Lunch

1:00-05:15 PM

Lab sessions III and IV

Thursday
TBD

08:00-Noon

Lectures 7 and 8

Practical X-Ray Microanalysis, Image Processing Diagnostics

Noon-1:00 PM

Lunch

1:00-05:15 PM

Lab sessions V and VI

Friday
TBD

08:00-Noon

Lab Sessions VII and VIII

Noon-1:00 PM

Lunch

1:00-05:15 PM

Open Lab Sessions IX and X


Registration
Dr. Chittaranjan Sahay (Director)
Center for Manufacturing and Metrology
College of Engineering, Technology, and Architecture
University of Hartford
200 Bloomfield Avenue, West Hartford CT 06117

Email: sahay@hartford.edu
Fax: 860.768.5073
Phone 860.768.4852


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